Zinc Sulphide (ZnS) thin films were deposited by dip coating method on a glass substrate. The synthesized thin film was characterized by X-Ray diffraction technique (XRD), Scanning Electron Microscopy (SEM), UV-VISIBLE Spectrophotometer, Four probe method and Hall Effect method. The XRD Patterns of the synthesized film show the preferred orientation of (111) planes, confirming the Cubic structure of ZnS. Surface morphology of thin film were studied using Scanning Electron Microscopy. The optical properties of the deposited film were characterized by UV-VIS spectrometry and show the presence of direct transition with band gap energy about 3.2 eV. The hot probe and four probe method shows n-type conductivity of the prepared ZnS film. In addition to that the carrier concentration and mobility was in the range of 1020 cm-3 and 10 to 17 respectively measured using Hall-effect Method.
