Chemical method was utilized to fabricate Zinc Sulphide (ZnS) Nanocrystalline thin films. These films were prepared by changing the [S]/[Zn] ratio in the solution. All the films were characterized by X-Ray diffraction (XRD), Scanning Electron Microscopy (SEM), UV-VISIBLE Spectroscopy, Hot probe, four probe and Hall Effect technique. The XRD Patterns of the synthesized film show the preferred orientation of (111), (220) and (311) planes, confirming the Cubic structure of ZnS. Surface morphology of thin film were studied using SEM. The optical properties of the prepared film were characterized by UV-VIS spectrometry and show the presence of direct transition with band gap energy about 3.14 eV. The conductivity, carrier concentration and mobility were measured.
