X-Ray Peak Profile Analysis Of Zn1-x MgxO Thin Films By Silar Method

In this paper, we reported Zn1-xMgxO thin films were prepared by successive ionic layer adsorption and reaction (SILAR) method. The prepared films were characterized by x-ray diffraction. The hexagonal wurzite nature of the prepared material was confirmed. The micro-structural properties such as grain size, dislocation density, texture coefficient and structural properties such as lattice constants, bond length and bond angles were evaluated