CdS thin films were prepared on a glass substrates using dip coating method. The influence of the preparation technique on the structural, optical and electrical properties of polycrystalline CdS thin films were characterized by X-Ray diffraction technique (XRD), Scanning Electron Microscope (SEM), Ultraviolet – Visible spectroscopy and Hot probe method. The XRD pattern reveals the formation of CdS thin films with the preferred orientation (111), (220) and (311) planes confirms the cubic structure of CdS films. Surface morphology of thin film was studied using Scanning Electron Microscopy (SEM). The optical properties of the deposited film were characterized by UV-VIS spectrometry and show the presence of direct transition with band gap energy of 2.56 eV. The hot probe method shows n-type conductivity of the prepared CdS film.
