Thin films of Zinc Sulphide (ZnS) were prepared by dip coating method. These films were investigated as a function of [S]/[Zn] ratio in the solution. ZnS thin film was characterized by X-Ray diffraction technique (XRD), Scanning Electron Microscopy (SEM), Automatic force microscopy (AFM), UV-VISIBLE Spectrophotometer, Hot probe, Four probe and Hall Effect technique. The XRD Patterns of the synthesized film show the preferred orientation of (111) planes, confirming the Cubic structure of ZnS. Surface morphology of thin film were studied using Scanning Electron Microscopy. The optical properties of the prepared film were characterized by UV-VIS spectrometry and show the presence of direct transition with band gap energy about 3.03 eV. The hot probe and four probe method shows n-type conductivity of the prepared ZnS film. Here the carrier concentration and mobility were measured.
